Copyright 2005 Agrawal BushnellLecture 11: BIST Copyright 2005 Agrawal BushnellLecture 11: BISTCopyright 2005 Agrawal BushnellLecture 11: BIST1VLSI Testing Lecture 11: BISTDefinition of BISTPatter

Copyright 2001 Agrawal BushnellVLSI Test: Lecture 22Lecture 22Delta IDDQ Testing and Built-In Current TestingCurrent limit settingTesting time issuesDelta IDDQ testing (D IDDQ)Built-in current testi

Edit Master Title StyleClick Copyright 2001 Agrawal BushnellVLSI Test: Lecture 2Lecture 2VLSI Test Process and EquipmentMotivationTypes of TestingTest Specifications and PlanTest ProgrammingTest Dat

Cliquez pour modifier le style du titre du masqueCliquez pour modifier les styles du texte du masqueDeuxième niveauTroisième niveauQuatrième niveauCinquième niveauVLSI TESTINGMEMORY BISTby:Saeid Hashe

Click to Edit Master Title StyleClick to edit Master text stylesSecond LevelThird LevelFourth LevelFifth LevelCopyright 2001 Agrawal BushnellVLSI Test: Lecture 19Lecture 19Fault-Model Based Structura

Click to Edit Master Title StyleClick to edit Master text stylesSecond LevelThird LevelFourth LevelFifth LevelCopyright 2001 Agrawal BushnellVLSI Test: Lecture 21Lecture 21IDDQ Current Testing Defini

VLSI Testing and DFT CourseTestability MeasureTestability Measure What do we mean when we say a circuit is testable Definition: A fault is testable if there exists a well-specified procedure to

Click to edit Master title styleClick to edit Master text stylesSecond levelThird levelFourth levelFifth levelOct.24 2007Agrawal: VLSI Testing EffectivenessOct.24 2007Agrawal: VLSI Testing Effectivene

Edit Master Title StyleClick Copyright 2005 Agrawal BushnellVLSI Test: Lecture 18altLecture 18altIDDQ Testing(Alternative for Lectures 21 and 22) Definition Faults detected by IDDQ tests Weak fault